Luciano Bonaria, presidente y CEO de SPEA, habla sobre el nuevo T100

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—Seleziona un'opzione—Flying Probe TestersIn-circuit Board TestersFunctional TestersQSoftLeonardo OSMEMS Sensors Test CellsMEMS Sensors Stimulus UnitsPick and Place HandlersMEMS Device-Oriented TestersPower Module test CellsSmart Card Test CellsSemiconductor IC TestersSmart Card HF UHF TestersReel to Reel Handlers

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—Seleziona un'opzione—SuggestionComplaint

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