SPEA showcases Semiconductor Testers at Semicon West 2023

SPEA exhibits test innovations for mixed signal and power semiconductors introducing Auto Maintenance technology on testing platforms

SPEA announces the company will make its annual presence at Semicon West 2023 in San Francisco, from July 11 to 13, 2023.

At the Moscone Center, SPEA’s innovation and expertise will position the brand as a premiere technology solutions company in an industry where product quality and reliability are of the utmost importance.

At booth #1161 located in South hall, SPEA will showcase its envision of the future of testing, with an exhibition of the following new technologies.

Auto Maintenance Capabilities on DOT Test Platform

Advanced predictive maintenance activities are automatically carried out by SPEA DOT testers: these systems are now able to collect, analyze and notify any deviation from standard performances, in order to take the required actions and avoid process degradations and system downtime.

All DOT instruments have an on-board memory used to evaluate their mechanical wear, while the tester autonomously verifies the instrument calibration data (with no need to remove the load board) and, when performances are out of specs, automatically launches the instrument calibration procedure.

An in-depth view of Auto Maintenance advantages will be offered during dedicated speeches at the Test Vision Symposium, and Best of West stages.

New High-Speed Digital Channel Module for DOT Mixed Signal Testers

A new 3.2Gbps card option for SPEA DOT testers addresses key technologies like wireless broadband communications, high-performance computing, medical imaging, artificial intelligence, consumer audio and video, automotive connectivity.

DOT testers are now able to offer the highest cost-efficiency covering the test requirements of next-generation SerDes, DAC/ADC converters, buffer/level translators, DVI/HDMI interfaces, SoC and microcontrollers.

Featuring up to 128 digital channels on a single instrument, the new channel option enables high multi-site, cost-efficient testing of high-speed communication interface devices, which require a spread spectrum modulation on channels and clock signals to verify their signal integrity and robustness against EMI.

Designed with per-pin DSP and a comprehensive DSP library for digital data calculation, the module reduces the test time and simplifies the pin/channel assignment, speeding up the load board development. Protocol aware architecture contributes to efficiently implementing DUT communication on a wide variety of standard protocols, reducing pattern complexity and test program execution time, while simplifying the debug and characterization process.

Flexible waveform generation, low-jitter high-speed clock signals with jitter modulation, and timing flexibility, are the perfect fit for testing high-speed applications.

Device Oriented Tester: Your Tester, in a Board

The successful DOT test platform will be on display at SPEA’s booth in San Francisco. This innovative analog mixed signal tester is based on a revolutionary tester-in-a-board concept: All the test resources are housed on a single instrument board, allowing a substantial simplification of the load board connections between tester channels and devices under test.

DOT’s multi-processor, multi-function channel instrument combines analog, digital and signal processing capabilities, including multiple control CPUs, DSP modules and programmable logic units.

The board is modular and configurable: It can be composed with an on-board controller, and up to four channel cards that can be selected to build the perfect performance mix to satisfy the customer’s test requirements, for a total of up to 256 channels in a single instrument slot.

Each individual channel card features a dedicated matrix card, simplifying the design of the load board and reducing the quantity of relays installed. The tester can be populated with one-type instruments, greatly simplifying system composition, programming and maintenance, while satisfying at best all the device test requirements.

Complete solutions for power semiconductor testing

With its DOT800T, SPEA provides a complete solution for Power testing, combining on a single machine all the resources to perform ISO, AC, DC test on the whole range of power applications.

This tester is expressly designed to address the test requirements of traditional Silicon devices as well as new Gallium Nitride and Silicon Carbide technologies, covering their performance range with the highest voltage and current source capabilities, high frequency and low current measurement capabilities.

A multi-core architecture allows DOT800T to perform accurate static, dynamic and isolation tests on dedicated stations, each of which with a dedicated independent controller. The different test programs are performed in a true parallel, asynchronous mode, since each test core controller manages test resources, instrument connections, and test program execution.

Share with