SPEA exhibits at Semicon China 2023

Showcasing technologies for the production test of MEMS, mixed-signal, power devices

SPEA announces the company will be present at Semicon China 2023 in Shanghai. With full-category offerings, SPEA will show how a global testing player will make the production test of semiconductor devices more effective and performant, building a path forward to Product quality and reliability.

Semicon attendees are invited to visit SPEA at booth #E3363 at the Shanghai New International Expo Centre from June 29 to July 1, to explore the performance and functionality of the latest additions to the SPEA testing equipment portfolio.

DOT Mixed-Signal Test Platform

The successful DOT test platform will be on display at SPEA’s booth in Shanghai. These innovative mixed signal testers are based on a revolutionary tester-in-a-board concept: All the test resources are housed on a single board, allowing the user to greatly simplify the load board connections between tester channels and devices under test.

The multi-processor, multi-function channel instrument combines analog, digital and signal processing capabilities, including multiple control CPUs, DSP modules and programmable logic units.

The instrument is modular and configurable: It can be composed with an on-board controller, and up to four channel cards that can be selected to build the perfect performance mix to satisfy the customer’s test requirements, for a total of up to 256 channels in a single instrument slot.

Each individual channel card features a dedicated matrix card, simplifying the design of the load board and reducing the quantity of relays installed.

Instead of having many instruments of different types (each one dedicated to a specific function), the tester can be populated with instruments of the same type, replicated in the number required to reach the desired multisite performance.

This architecture greatly simplifies the system composition, programming and maintenance, while satisfying at best all the device test requirements.

Complete Solutions for Power Semiconductor Testing

With its DOT800T, SPEA provides a complete solution for Power testing, combining on a single machine all the resources to perform ISO, AC, DC test on the whole range of power applications.

This tester is expressly designed to address the test requirements of traditional Silicon devices as well as new Gallium Nitride and Silicon Carbide technologies, covering their performance range with the highest voltage and current source capabilities, high frequency and low current measurement capabilities.

A multi-core architecture allows DOT800T to perform accurate static, dynamic and isolation tests on dedicated stations, each of which with a dedicated independent controller. T

he different test programs are performed in a true parallel, asynchronous mode, since each test core controller manages test resources, instrument connections, and test program execution.

Expanding MEMS Test Capabilities

SPEA, with its recognized industry-leading test cells for MEMS devices, combines in a single machine all the elements for the handling, contacting, physical stimulus and complete testing and calibration of MEMS and sensor devices, at ambient or temperature conditions.

On the H3580 handler platform, multiple stimuli can be housed in a single test unit, to test combo MEMS, such as environmental sensors (pressure + humidity + gas + temperature) or navigation sensors (accelerometer + gyroscope + compass). Throughput capabilities are over 33,000 units per hour, offering the possibility to test as many as 396 devices simultaneously.

The flexible and modular architecture facilitates an easy in-field reconfiguration of the test area, replacing MEMS stimulus units and test modules. The same, standard machine, can be used to test different device families, and also different package technologies, from standard packages to latest chip-scale devices.

In Shanghai, SPEA’s MEMS test technology will be represented by the highly successful inertial test unit for testing low g accelerometers and gyroscopes, by accurately stimulating with precise and reliable angular position, rate and acceleration motion.

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